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Achieving High-resolution of Large Specimens Using Aberration-corrected Tomography

Published online by Cambridge University Press:  30 July 2020

Reed Yalisove
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Suk Hyun Sung
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Jonathan Schwartz
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Catherine Groschner
Affiliation:
University of California Berkeley, Berkeley, California, United States
Philipp Pelz
Affiliation:
University of California Berkeley, Berkeley, California, United States
Huihuo Zheng
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Yi Jiang
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Mary Scott
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Peter Ercius
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Robert Hovden
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Copyright
Copyright © Microscopy Society of America 2020

References

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This research used resources of the Oak Ridge Leadership Computing Facility, which is a DOE Office of Science User Facility supported under Contract DE-AC05-00OR22725.Google Scholar
Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar
This research used resources of the Argonne Leadership Computing Facility, which is a DOE Office of Science User Facility supported under Contract DE-AC02-06CH11357, and resources of the Oak Ridge Leadership Computing Facility, which is a DOE Office of Science User Facility supported under Contract DE-AC05-00OR22725.Google Scholar