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Achieving High-resolution of Large Specimens Using Aberration-corrected Tomography
Published online by Cambridge University Press: 30 July 2020
Abstract
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- FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
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- Copyright
- Copyright © Microscopy Society of America 2020
References
Batson, P. E., Delby, N., and Krivanek, O. L., Nature 418 (2002) p. 617.10.1038/nature00972CrossRefGoogle Scholar
Yalisove, R., Sung, S. H., Hovden, R., Microsc. Microanal. 25(Suppl 2) (2019) p. 181010.1017/S1431927619009784CrossRefGoogle Scholar
Cowley, J.M., Moodie, A.F.. Acta Cryst. 10 (1957) p. 609-619.10.1107/S0365110X57002194CrossRefGoogle Scholar
Hegerl, R., Hoppe, W., Zeitschrift für Naturforschung A 31(12) (1976) p. 1717-1721.10.1515/zna-1976-1241CrossRefGoogle Scholar
Saxberg, B., Saxton, W., Ultramicroscopy 6 (1981) p. 85-90.10.1016/S0304-3991(81)80182-9CrossRefGoogle Scholar
This research used resources of the Oak Ridge Leadership Computing Facility, which is a DOE Office of Science User Facility supported under Contract DE-AC05-00OR22725.Google Scholar
Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar
This research used resources of the Argonne Leadership Computing Facility, which is a DOE Office of Science User Facility supported under Contract DE-AC02-06CH11357, and resources of the Oak Ridge Leadership Computing Facility, which is a DOE Office of Science User Facility supported under Contract DE-AC05-00OR22725.Google Scholar
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