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Accurate Measurement of Electric Potential Distributions at the Interfaces in Solids Using Phase-shifting Electron Holography
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Direct Phase Imaging with Coherent Electron Beam in TEM
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Tonomura, A., Electron Holography 2nd ed. (Springer, New York, 1999).10.1007/978-3-540-37204-2CrossRefGoogle Scholar
Nomura, Y. et al. ., Angew. Chem. Int. Ed. 58, 5292 (2019).10.1002/anie.201814669CrossRefGoogle Scholar
We thank Dr. Yujin Hori, Dr. Kouhei Kinugawa, Dr. Akihiro Imamura of Furukawa Electric Co. Ltd., Dr. Satoru Ouchi, Dr. Emiko Egaki of Panasonic Corporation, and Prof. Naoya Shibata of the University of Tokyo for valuable discussions. This research was partially supported by the Project for Promoting Public Utilization of the Advanced Research Infrastructure Grant from the Ministry of Education, Culture, Sports, Science, and Technology, and Japan Society for the Promotion of Science (JSPS), Grant-in-Aid for Scientific Research KAKENHI (JP 17H02792).Google Scholar