Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T15:13:37.112Z Has data issue: false hasContentIssue false
  • English
  • Français

Utilization of Atomic Force Microscopy, Confocal Microscopy, and Electron Microscopy to Evaluate Biomass Pretreatment

Published online by Cambridge University Press:  03 August 2008

B Simmons ,
D Dibble ,
S Singh ,
M Auer ,
D Jorgens  and
J-L Faulon
B Simmons
Affiliation:
Sandia National Laboratories
D Dibble
Affiliation:
Sandia National Laboratories
S Singh
Affiliation:
Sandia National Laboratories
M Auer
Affiliation:
Lawrence Berkeley National Laboratory
D Jorgens
Affiliation:
Lawrence Berkeley National Laboratory
J-L Faulon
Affiliation:
Sandia National Laboratories
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1492 - 1493
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)