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Thinning and Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy

Published online by Cambridge University Press:  05 September 2003

Wolfgang Gruenewald
Wolfgang Gruenewald*
Affiliation:
BAL-TEC Innovation Centre, Chemnitz, Germany
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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 526 - 527
Copyright
Copyright © Microscopy Society of America 2003

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