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SEM, EPMA and TXRF characterization of electrochemically modified electrode surfaces

Published online by Cambridge University Press:  05 September 2003

Nikolai Alov ,
Doris Ceglarek ,
Axel Wittershagen  and
Bernd O. Kolbesen
Nikolai Alov
Affiliation:
Department of Analytical Chemistry, M. V. Lomonosov Moscow State University, 119992 Moscow, Russia
Doris Ceglarek
Affiliation:
Department of Inorganic Chemistry / Analytical Chemistry, J. W. Goethe University of Frankfurt am Main, D-60439 Frankfurt am Main, Germany
Axel Wittershagen
Affiliation:
SEZ AG, 9500 Villach, Austria
Bernd O. Kolbesen
Affiliation:
Department of Inorganic Chemistry / Analytical Chemistry, J. W. Goethe University of Frankfurt am Main, D-60439 Frankfurt am Main, Germany
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Abstract

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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 138 - 139
Copyright
Copyright © Microscopy Society of America 2003

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