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Evaluation of a Lead Lanthanum Zirconium Titanate (Plzt) Specimen for Use as an Electron Microprobe Reference Material

Published online by Cambridge University Press:  02 July 2020

R. B. Marinenko ,
Z. Samardzija ,
S. Bernik ,
M. Kosec  and
M. Ceh
R. B. Marinenko
Affiliation:
National Institute of Standards and Technology (NIST), 100 Bureau Dr., MS 8371, Gaithersburg, MD, 20899-8371
Z. Samardzija
Affiliation:
Jozef Stefan Institute, Ceramics Department, Jamova 39, 1000, Ljubljana, Slovenia
S. Bernik
Affiliation:
Jozef Stefan Institute, Ceramics Department, Jamova 39, 1000, Ljubljana, Slovenia
M. Kosec
Affiliation:
Jozef Stefan Institute, Ceramics Department, Jamova 39, 1000, Ljubljana, Slovenia
M. Ceh
Affiliation:
Jozef Stefan Institute, Ceramics Department, Jamova 39, 1000, Ljubljana, Slovenia
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Abstract

Lead lanthanum zirconium titanate (PLZT), or (Pb,La)(Zr,Ti)O3 solid solutions, ferroelectric ceramics are being studied for electro-optical applications, as well as for high-speed electrophoretic printing. Thin films of a related material, lead zirconium titanate, or Pb(Zr,Ti)O3 solid solutions (PZT), are used for non-volatile memories and actuators.1 Proper composition and compositional homogeneity of ferroelectric ceramics are essential for application, however the fabrication process may produce materials with element concentrations and thus physical characteristics that may differ from expectation. Therefore, a PLZT reference material for determining the composition of these ceramics would be useful. It will also be useful for quantitative microanalysis; it is stable under the point beam of the electron microprobe (EPMA) at excitation voltages up to 25 kV and probably higher at currents of more than 100 nA.

A specimen of PLZT prepared by the Ceramics Department of the Jozef Stefan Institute in Ljubljana, Slovenia was studied with the electron microprobe to determine the composition and the extent of heterogeneity.

Type
Quantitative X-Ray Microanalysis in the Microprobe, in the SEM and in The ESEM:Theory and Practice (Organized by R. Gauvin and E. Lifshin)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 680 - 681
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Auciello, O. et al., Physics Today, 51(1998)22.CrossRefGoogle Scholar
2.ISO Guide 35, Certification of reference material — General and statistical principles, 2nd ed. Switzerland: Intemat. Org. for Standardization (1989).Google Scholar
3.Neter, J. et al. Applied Linear Statistical Models, 4th ed. Chicago Irwin/ McGraw-Hill (1996).Google Scholar
4.Bastin, G.F. and Heijligers, H.J.M., in Heinrich, K. F. J. and Newbury, D. E., Eds., Electron Probe Quantitation, New York Penum Press, (1991) 145.CrossRefGoogle Scholar