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Aberration-Corrected X-Ray Spectrum Imaging and Fresnel Contrast to Differentiate Nanoclusters and Cavities in Helium-Irradiated Alloy 14YWT

Published online by Cambridge University Press:  06 March 2014

Chad M. Parish  and
Michael K. Miller
Chad M. Parish*
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN 37831, USA
Michael K. Miller
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN 37831, USA
*
*Corresponding author.[email protected]
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Abstract

Helium accumulation negatively impacts structural materials used in neutron-irradiated environments, such as fission and fusion reactors. Next-generation fission and fusion reactors will require structural materials, such as steels, that are resistant to large neutron doses yet see service temperatures in the range most affected by helium embrittlement. Previous work has indicated the difficulty of experimentally differentiating nanometer-sized cavities such as helium bubbles from the Ti–Y–O rich nanoclusters (NCs) in radiation-tolerant nanostructured ferritic alloys (NFAs). Because the NCs are expected to sequester helium away from grain boundaries and reduce embrittlement, experimental methods to study simultaneously the NC and bubble populations are needed. In this study, aberration-corrected scanning transmission electron microscopy (STEM) results combining high-collection-efficiency X-ray spectrum images (SIs), multivariate statistical analysis (MVSA), and Fresnel-contrast bright-field STEM imaging, have been used for such a purpose. Fresnel-contrast imaging, with careful attention to TEM-STEM reciprocity, differentiates bubbles from NCs. MVSA of X-ray SIs unambiguously identifies NCs. Therefore, combined Fresnel-contrast STEM and X-ray SI is an effective STEM-based method to characterize helium-bearing NFAs.

Keywords

EDSFresnel contrastaberration correctionmultivariate statistical analysisnanostructured ferritic alloy
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 20 , Issue 2 , April 2014 , pp. 613 - 626
Copyright
© Microscopy Society of America 2014 

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Footnotes

This manuscript has been authored by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the US Department of Energy. The US Government retains and is the publisher, by accepting the article for publication, acknowledges that the US Government retains a nonexclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US Government purposes.

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