Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-09T08:31:53.695Z Has data issue: false hasContentIssue false

4D Scanning Electron Confocal Imaging and Visualization of Projected Bloch States

Published online by Cambridge University Press:  30 July 2020

Andrew Barnum
Affiliation:
Thermo Fisher Scientific, Hillsboro, Oregon, United States
Mark Williamson
Affiliation:
Thermo Fisher Scientific, Hillsboro, Oregon, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Copyright
Copyright © Microscopy Society of America 2020

References

Nellist, P. D, Behan, G., Kirkland, A. I, Hetherington, C. J. D, and University of Oxford, Oxford Ox1 3ph Department of Materials. “Confocal Operation of a Transmission Electron Microscope with Two Aberration Correctors.” Applied Physics Letters 89, no. 12 (2006): Applied Physics Letters, 18 September 2006, Vol.89(12).10.1063/1.2356699CrossRefGoogle Scholar
Frigo, S., Levine, , Zaluzec, , Materials Science Division, Northern Arizona Univ, Nist, and Argonne National Lab. “Sub-micron Imaging of Buried Integrated Circuit Structures Using Scanning Confocal Electron Microscopy.Appl. Phys. Lett 81, no. 11 (2002): 2112-2114.10.1063/1.1506010CrossRefGoogle Scholar
Hillyar, S. and Silcox, J. (1995). Detector geometry, TDS and strain in ADF STEM. Ultramicroscopy, 58, 610.1016/0304-3991(94)00173-KCrossRefGoogle Scholar