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Temperature and reactive etching effects on the microstructure of microwave plasma deposited diamond films
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- 31 January 2011, pp. 818-823
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Microstructure and conversion electron Mössbauer studies of M decrease in Fe3O4 films
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- Published online by Cambridge University Press:
- 31 January 2011, pp. 824-828
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Classification and consequences of complex lead perovskite ferroelectrics with regard to B-site cation order
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- 31 January 2011, pp. 829-834
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MASS-NMR structural analysis of barium aluminofluorophosphate glasses with and without nitridation
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- 31 January 2011, pp. 835-840
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Hole pattern formation in unfired ceramic sheets by pulsed Nd:YAG laser
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- Published online by Cambridge University Press:
- 31 January 2011, pp. 841-846
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Instrumentation of a conventional hardness tester for load-displacement measurement during indentation
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- 31 January 2011, pp. 847-851
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Materials Reports
Fundamental issues in heteroepitaxy—A Department of Energy, Council on Materials Science Panel Report*
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- 31 January 2011, pp. 852-894
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Erratum
Erratum: “MoS2−xOx solid solutions in thin films produced by rf-sputter-deposition” [J. Mater. Res. 5, 218 (1990)]
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- 31 January 2011, p. 895
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