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The effect of target crystallography on the growth of Pb(Mg1/3Nb2/3)O3 thin films using pulsed laser deposition

Published online by Cambridge University Press:  31 January 2011

M. H. Corbett ,
G. Catalan ,
R. M. Bowman  and
J. M. Gregg
M. H. Corbett
Affiliation:
Condensed Matter Physics and Materials Science Research Division, School of Mathematics and Physics, The Queen's University of Belfast, Belfast BT7 1NN, United Kingdom
G. Catalan
Affiliation:
Condensed Matter Physics and Materials Science Research Division, School of Mathematics and Physics, The Queen's University of Belfast, Belfast BT7 1NN, United Kingdom
R. M. Bowman*
Affiliation:
Condensed Matter Physics and Materials Science Research Division, School of Mathematics and Physics, The Queen's University of Belfast, Belfast BT7 1NN, United Kingdom
J. M. Gregg
Affiliation:
Condensed Matter Physics and Materials Science Research Division, School of Mathematics and Physics, The Queen's University of Belfast, Belfast BT7 1NN, United Kingdom
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Pulsed laser deposition has been used to make two sets of lead magnesium niobate thin films grown on single-crystal h100j MgO substrates. One set was fabricated using a perovskite-rich target while the other used a pyrochlore-rich target. It was found that the growth conditions required to produce almost 100% perovskite Pb(Mg1/3Nb2/3)O3 (PMN) films were largely independent of target crystallography. Films were characterized crystallographically using x-ray diffraction and plan view transmission electron microscopy, chemically using energy dispersive x-ray analysis, and electrically by fabricating a planar thin film capacitor structure and monitoring capacitance as a function of temperature. All characterization techniques indicated that perovskite PMN thin films had been successfully fabricated.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 6 , June 1999 , pp. 2355 - 2358
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Luan, L.J., Li, L. T., and Gui, Z.L., J. Mater. Res. 13, 253 (1998).Google Scholar
2.Park, S-E. and Shrout, T. R., IEEE Ultrason. Symp. Proc., 935 (1996).Google Scholar
3.Landolt–Börnstein, , Numerical Data and Functional Relationships in Science and Technology, edited by Hellwege, K. H. (Springer-Verlag, Berlin), Vol. 16–a, 101 (1981).Google Scholar
4.Lejeune, M. and Boilot, J. P., J. de Physique: Colloque C1 2, C1–895 (1988).Google Scholar
5.Swartz, S.L. and Shrout, T. R., Mater. Res. Bull. 17, 1245 (1982).CrossRefGoogle Scholar
6.Guha, J. P. and Anderson, H. U., J. Am. Ceram. Soc. 69, 287 (1986).Google Scholar
7.Trtik, V., Jelinek, M., and Kluenkov, E. B., J. Phys. D: Appl. Phys. 27, 1544 (1994).CrossRefGoogle Scholar
8.Tantigate, C., Lee, J., and Safari, A., Appl. Phys. Lett. 66, 1611 (1995).CrossRefGoogle Scholar
9.Gregg, J. M. and Bowman, R. M., Appl. Phys. Lett. 71, 3649 (1997).CrossRefGoogle Scholar
10.Chaput, F., Boilot, J-P., Lejeune, M., Papiernik, R., and Hubert-Pfalzgraf, L. G., J. Am. Ceram. Soc. 72, 1335 (1989).CrossRefGoogle Scholar
11.Bowman, R.M., O'Neill, D., McCurry, M., and Gregg, J.M., Appl. Phys. Lett. 70, 2622 (1997).CrossRefGoogle Scholar
12.Hirsch, P.B., Howie, A., Nicholson, R. B., Pashley, D.W., and Whelan, M.J., Electron Microscopy of Thin Films (Butterworth, London, 1965).Google Scholar