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Comparative study of the oxide scale thermally grown on titanium alloys by ion beam analysis techniques and scanning electron microscopy

Published online by Cambridge University Press:  31 January 2011

A. Gutiérrez ,
F. Pászti ,
A. Climent-Font ,
J.A. Jiménez  and
M.F. López
A. Gutiérrez*
Affiliation:
Departamento de Física Aplicada, Universidad Autónoma de Madrid, Cantoblanco, E-28049 Madrid, Spain
F. Pászti
Affiliation:
KFKI Research Institute for Particle and Nuclear Physics, H-1525 Budapest, Hungary; and Centro de Microanálisis de Materiales, Cantoblanco, E-28049 Madrid, Spain
A. Climent-Font
Affiliation:
Departamento de Física Aplicada, Universidad Autónoma de Madrid, Cantoblanco, E-28049 Madrid, Spain; and Centro de Microanálisis de Materiales, Cantoblanco, E-28049 Madrid, Spain
J.A. Jiménez
Affiliation:
Centro Nacional de Investigaciones Metalúrgicas, CSIC, E-28040 Madrid, Spain
M.F. López
Affiliation:
Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, E-28049 Madrid, Spain
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

In the present work, the oxide layers developed at elevated temperature on three vanadium-free titanium alloys, of interest as implant biomaterials, were studied by Rutherford backscattering spectroscopy, elastic recoil detection analysis, and scanning electron microscopy. The chemical composition of the alloys investigated, in wt%, was Ti–7Nb–6Al, Ti–13Nb–13Zr, and Ti–15Zr–4Nb. Upon oxidation in air at 750 °C, an oxide scale forms, with a chemical composition, morphology, and thickness that depend on the alloy composition and the oxidation time. After equal exposure time, the Ti–7Nb–6Al alloy exhibited the thinnest oxide layer due to the formation of an Al2O3-rich layer. The oxide scale of the two TiNbZr alloys is mainly composed of Ti oxides, with small amounts of Nb and Zr dissolved. For both TiNbZr alloys, the role of the Nb-content on the mechanism of the oxide formation is discussed.

Keywords

Ion Beam AnalysisOxidationScanning electron microscopy (SEM)
Type
Articles
Information
Journal of Materials Research , Volume 23 , Issue 8 , August 2008 , pp. 2245 - 2253
Copyright
Copyright © Materials Research Society 2008

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References

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