Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-23T15:46:58.825Z Has data issue: false hasContentIssue false
  • English
  • Français

Experimental Considerations and Limitations in the Application of Ultra High Temperature (2100°C) X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

Sampath S. Iyengar
Sampath S. Iyengar*
Affiliation:
B2 Research 4440 Warrensville Center Rd Cleveland, Ohio 44128
Get access

Extract

In-situ, high temperature X-ray diffraction (XRD) is an extremely useful tool for studying, monitoring or investigating crystal structure modifications as well as phase transformations in crystalline material during thermal treatments in controlled atmospheres. This technique has been used to investigate the thermal behavior of materials such as carbonate minerals, ceramic fibers, coating pigments, etc. The advantages of such a technique over the conventional practice, where samples are heat treated in a separate oven and then analyzed by XRD include: consistency of sample placement; preservation of high temperature structures to facilitate observation of metastable phases that are unstable upon exposure to outside atmosphere or during cooling; real time monitoring of reactions that occur, and products that are formed at a desired temperature or environment; and need for multiple samples or analysis.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 425 - 429
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Iyengar, S.S., et al., Advances in X-ray Analysis, 28:331–338 (1985).Google Scholar
2. Loza, R.B. and Butler, R.J., Material Science Engr., 55:557 (1986) .Google Scholar
3. Campbell, W.J., High Temperature Diffraction Techniques, In X-ray Handbook, P: 13–1 to 13-22, McGraw-Hill, NY.Google Scholar
4. Cockayne, B., J. of. Less Common Metals, 114:199–206 (1985) .Google Scholar
5. Caslavsky, J.L. and Viechnicki, D.J., J. of Materials Science, 15: 1709–1718 (1980) .Google Scholar
6. Cockayne, B. and Lent, B., J. of Crystal Growth, 46:371–378 (1979).Google Scholar