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The ORNL Lectures on Scanning Probe Microscopy, Part 2: The Force Dimension: Electronic and Ionic Transport Measurements via Kelvin Probe Force Microscopy
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- Journal:
- Microscopy Today / Volume 27 / Issue 6 / November 2019
- Published online by Cambridge University Press:
- 29 October 2019, pp. 18-23
- Print publication:
- November 2019
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Metal Contacts on a-GaN
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 1 / 1996
- Published online by Cambridge University Press:
- 13 June 2014, e41
- Print publication:
- 1996
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