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Effects of misfit dislocation and film-thickness on the residual stresses in epitaxial thin film systems: Experimental analysis and modeling
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- Journal:
- Journal of Materials Research / Volume 27 / Issue 21 / 14 November 2012
- Published online by Cambridge University Press:
- 28 September 2012, pp. 2737-2745
- Print publication:
- 14 November 2012
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- Article
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