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Quantitative Thin-Film X-ray Microanalysis by STEM/HAADF: Statistical Analysis for Precision and Accuracy Determination
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 4 / August 2006
- Published online by Cambridge University Press:
- 14 July 2006, pp. 318-321
- Print publication:
- August 2006
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- Article
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