The room temperature X-ray powder diffraction pattern of Fe2GeSe4, a II2 □ IV VI4 semiconducting compound, has been recorded and evaluated. This material was found to be orthorhombic, a=13.069(1), b=7.559(1), c=6.2037(6) Å, V=612.83(9) Å3, Z=4, Dx=5.42 gcm−3. The structure refinement carried out using the Rietveld method indicated that this material crystallizes in space group Pnma (No. 62) with an olivine type of structure. The refinement of 33 parameters led to RWP=15.3%, RP=10.2% for 5251 step intensities and RB=9.44% and RF=9.36% for 913 reflections.
