We have explored the possibility of measuring small changes of
orientation within grains by electron backscattering diffraction (EBSD),
in the scanning electron microscope. Conventional orientation maps (using
EBSD) index the orientation of each position on the sample separately.
This does not give accurate results for small differences of orientation.
We have studied methods of measuring small changes in orientation by
measuring the change from one EBSD pattern to the next directly, without
indexing either. Previous workers have measured the change of position of
a zone axis in the EBSD pattern. We have compared this with an alternative
method, which we show to be superior, of measuring the shift of the peaks
in the Hough transform from one diffraction pattern to the next. This
means that we are measuring the change of orientation of sets of crystal
planes within the grain, rather than measuring the change of orientation
of zone axes. We show that it is possible, with a standard EBSD
configuration, to measure the shift of the Kikuchi bands to a precision of
about a 10th of a pixel, which corresponds to a change of orientation in
the sample of about 0.1 mrad (0.006°).