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An Operating Method with Lateral Scan for Reducing the Error in Topography Caused by the Tip-Sample Angle in Atomic Force Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 5 / October 2010
- Published online by Cambridge University Press:
- 24 August 2010, pp. 630-635
- Print publication:
- October 2010
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- Article
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