4 results
Atomic Resolution Phase Contrast Imaging and In-Line Holography Using Variable Voltage and Dose Rate
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 5 / October 2012
- Published online by Cambridge University Press:
- 22 October 2012, pp. 982-994
- Print publication:
- October 2012
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Measurement of Lattice Displacements at Planar Defects in 2H and 18R Martensites
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 2 / April 2004
- Published online by Cambridge University Press:
- 17 March 2004, pp. 236-246
- Print publication:
- April 2004
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The Formation of Clusters and Nanocrystals in Er-Implanted Hexagonal Silicon Carbide
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 2 / April 2004
- Published online by Cambridge University Press:
- 17 March 2004, pp. 301-310
- Print publication:
- April 2004
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Structural Evolution in Amorphous Silicon and Germanium Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue 4 / August 2002
- Published online by Cambridge University Press:
- 09 January 2003, pp. 268-273
- Print publication:
- August 2002
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