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Quantitative Transmission Electron Microscopy Analysis of the Pressure of Helium-Filled Cracks in Implanted Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 2 / April 2004
- Published online by Cambridge University Press:
- 17 March 2004, pp. 199-214
- Print publication:
- April 2004
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- Article
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