3 results
An Improved STEM/EDX Quantitative Method for Dopant Profiling at the Nanoscale
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 1 / February 2020
- Published online by Cambridge University Press:
- 10 January 2020, pp. 76-85
- Print publication:
- February 2020
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The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 3 / June 2009
- Published online by Cambridge University Press:
- 22 May 2009, pp. 237-243
- Print publication:
- June 2009
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Sample Preparation for Precise and Quantitative Electron Holographic Analysis of Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 4 / August 2006
- Published online by Cambridge University Press:
- 14 July 2006, pp. 295-301
- Print publication:
- August 2006
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