The most abundant silicates formed under the Earth's 'normal' surface conditions, i.e. clay minerals, are always of small grain size. Under the same conditions, other mineral species such as carbonates, sulphates and oxides may form much bigger crystals. The reason why phyllosilicates formed in soils or in weathered rocks are always of small grain size is not related to the low-temperature-pressure conditions but rather to particular aspects of their crystal structure. Many recently published works describe the order-disorder cation distribution in the tetrahedral and octahedral sheets and the crystal defects in the layer stacks. Related to the Periodic Bond Chains (PBCs) theory, these data suggest that the size and the shape of clay crystallites could depend on the amount of crystal defects in the three axes of symmetry [100], [10] and [0]. The accumulation of crystal defects poisons the crystal growth along one, two or three PBCs. Then, nucleation becomes less energy-consuming than crystal growth and favours the formation of numerous smaller crystals rather than fewer bigger ones.

An automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen’s surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM’s potential, automated analysis tools are required. The reconstruction algorithm developed here relies on minimal assumptions and is sensitive to atomic coordinates of all imaged atoms. It tracks the atoms across a sequence of images, allocating each to its respective crystallographic plane. The result is a highly accurate 3D lattice-resolved reconstruction. The procedure is applied to over 2000 tungsten atoms, including ion-implanted planes. The approach is further adapted to analyze carbides in a steel matrix, demonstrating its applicability to a range of materials. A vast amount of information is collected during the experiment that can underpin advanced analyses such as automated detection of “out of sequence” events, subangstrom surface displacements and defects effects on neighboring atoms. These analyses have the potential to reveal new insights into the field evaporation process and contribute to improving accuracy and scope of 3D FIM and atom probe characterization.