Applying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.

EBSDinterp is a graphic user interface (GUI)-based MATLAB® program to perform microstructurally constrained interpolation of nonindexed electron backscatter diffraction data points. The area available for interpolation is restricted using variations in pattern quality or band contrast (BC). Areas of low BC are not available for interpolation, and therefore cannot be erroneously filled by adjacent grains “growing” into them. Points with the most indexed neighbors are interpolated first and the required number of neighbors is reduced with each successive round until a minimum number of neighbors is reached. Further iterations allow more data points to be filled by reducing the BC threshold. This method ensures that the best quality points (those with high BC and most neighbors) are interpolated first, and that the interpolation is restricted to grain interiors before adjacent grains are grown together to produce a complete microstructure. The algorithm is implemented through a GUI, taking advantage of MATLAB®’s parallel processing toolbox to perform the interpolations rapidly so that a variety of parameters can be tested to ensure that the final microstructures are robust and artifact-free. The software is freely available through the CSIRO Data Access Portal (doi:10.4225/08/5510090C6E620) as both a compiled Windows executable and as source code.

Band contrast (BC) is a qualitative measure of electron back-scattered diffraction (EBSD), which is derived from the intensity of the Kikuchi bands. The BC is dependent upon several factors including scanning electron microscope measurement parameters, EBSD camera setup, and the specimen itself (lattice defect and grain orientation). In this study, the effective factors for BC variations and the feasibility of using BC variations for the quantification of microstructure evolutions have been investigated. In addition, the effects of the lattice defect and the grain orientation on the BC variations are studied. Next, a shear-deformed microstructure of 316L stainless steel, which contains nanosized grains and a large portion of twin boundaries, is revealed by BC map and histogram. Recovery and recrystallization of shear-deformed 316L stainless steel are displayed by BC variations during isothermal annealing at 700 and 800°C, respectively. It is observed that the BC turns bright as the shear-deformed crystal structure is recovered or recrystallized.