6 results
Assessing the Impact of Secondary Fluorescence on X-Ray Microanalysis Results from Semiconductor Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 25 May 2022, pp. 1472-1483
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- October 2022
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Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions
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- Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
- Published online by Cambridge University Press:
- 03 September 2020, pp. 895-905
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- October 2020
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Secondary Fluorescence of 3D Heterogeneous Materials Using a Hybrid Model
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- Microscopy and Microanalysis / Volume 26 / Issue 3 / June 2020
- Published online by Cambridge University Press:
- 27 May 2020, pp. 484-496
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- June 2020
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Secondary Fluorescence Correction for Characteristic and Bremsstrahlung X-Rays Using Monte Carlo X-ray Depth Distributions Applied to Bulk and Multilayer Materials
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- Microscopy and Microanalysis / Volume 25 / Issue 1 / February 2019
- Published online by Cambridge University Press:
- 14 March 2019, pp. 92-104
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- February 2019
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Secondary Fluorescence in WDS: The Role of Spectrometer Positioning
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- Microscopy and Microanalysis / Volume 24 / Issue 6 / December 2018
- Published online by Cambridge University Press:
- 03 December 2018, pp. 604-611
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- December 2018
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Efficient Simulation of Secondary Fluorescence Via NIST DTSA-II Monte Carlo
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 3 / June 2017
- Published online by Cambridge University Press:
- 13 March 2017, pp. 618-633
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- June 2017
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