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Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
- Published online by Cambridge University Press:
- 05 June 2017, pp. 708-716
- Print publication:
- August 2017
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- Article
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