2 results
In Situ Thermal Annealing Transmission Electron Microscopy (TEM) Investigation of III/V Semiconductor Heterostructures Using a Setup for Safe Usage of Toxic and Pyrophoric Gases
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
- Published online by Cambridge University Press:
- 08 August 2017, pp. 751-757
- Print publication:
- August 2017
-
- Article
- Export citation
Preparation and Loading Process of Single Crystalline Samples into a Gas Environmental Cell Holder for In Situ Atomic Resolution Scanning Transmission Electron Microscopic Observation
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 3 / June 2016
- Published online by Cambridge University Press:
- 30 March 2016, pp. 515-519
- Print publication:
- June 2016
-
- Article
- Export citation