International standard ISO-25498 specifies the method of selected area electron diffraction (SAED) analysis in TEM. It is applicable to the acquisition of SAED patterns, indexing the patterns and calibration of diffraction constant. Several features of this standard are introduced. As an example of the applications, phosphide with nanometer scale in a low-carbon steel produced by compact strip production process was analyzed by SAED and EDX. The phosphide precipitates in the steel are identified as MxP, where x is 2–3 and M is Fe, Ti, Cr, or Ni. It possesses a hexagonal lattice with lattice parameter a = 0.609 nm and c = 0.351 nm.
