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Aberration-Corrected Scanning Transmission Electron Microscope (STEM) Through-Focus Imaging for Three-Dimensional Atomic Analysis of Bismuth Segregation on Copper [001]/33° Twist Bicrystal Grain Boundaries
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 3 / June 2016
- Published online by Cambridge University Press:
- 05 May 2016, pp. 679-689
- Print publication:
- June 2016
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- Article
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