4 results
Compressive strain-induced metal–insulator transition in orthorhombic SrIrO3 thin films
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- Journal:
- Journal of Materials Research / Volume 29 / Issue 21 / 14 November 2014
- Published online by Cambridge University Press:
- 21 October 2014, pp. 2491-2496
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- 14 November 2014
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New Method for Deep 90° Slope Cuttings of Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 798-799
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- August 2007
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Precise Ion Milling and 3D TEM technique to Deal with Feature Blocking in TEM Viewing Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1240-1241
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- August 2006
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New Ion Beam Milling System for Fast and Efficient Site Specific Sample Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 956-957
- Print publication:
- August 2004
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