20 results
Phase Transformations and Surface/Interface Properties in Functional Perovskites with Aberration-Corrected STEM/EELS
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2429-2430
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- August 2015
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Functionalization of Graphene
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 737-738
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- August 2015
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Stabilization of Nanopores in Graphene
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 1732-1733
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- August 2014
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Low Voltage STEM for the Study of Defects in 2D Materials
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1232-1233
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- August 2013
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Identifying the Optical Response of Graphene Using Electron Energy-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1938-1939
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- August 2013
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AB/AC Stacking Boundaries in Bilayer Graphene
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1942-1943
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- August 2013
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Interplay of Octahedral Rotations, Magnetic and Electronic Properties in Epitaxial LaCoO3 Thin Films
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1924-1925
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- August 2013
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Insights Into Energy Materials Through Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1354-1355
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- July 2012
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Simulation Of Electron Energy Loss Near Edge Structure At Atomic Resolution For Aberration Corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1490-1491
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- July 2012
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Single Atom Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 342-343
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- July 2012
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Dynamics and White Light Emission from CdSe Nanocrystals
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1830-1831
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- July 2012
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Unit-cell Scale Measurements of Oxygen Vacancy Concentration and Homogeneity in SOFC Cobaltite Thin Films
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1310-1311
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- July 2012
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Studies of Single Dopant Atoms on Nanocrystalline γ-Alumina Supports by Aberration-Corrected Z-contrast STEM and First Principles Calculations
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 19 July 2003, pp. 398-399
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- August 2003
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Passivation of Oxide Layers on 4H-SiC Using Sequential Anneals in Nitric Oxide and Hydrogen
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- MRS Online Proceedings Library Archive / Volume 786 / 2003
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- 01 February 2011, E8.1
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- 2003
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Theory and simulations of the interactions of intense radiation with atoms, molecules, and solids
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- Laser and Particle Beams / Volume 18 / Issue 3 / July 2000
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- 09 April 2001, pp. 557-562
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A Theoretical Study of p-Type Doping of ZnO: Problems and Solutions
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- MRS Online Proceedings Library Archive / Volume 666 / 2001
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- 21 March 2011, F2.6
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- 2001
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The Effects of Post-Oxidation Anneal Conditions on Interface State Density Near the Conduction Band Edge and Inversion Channel Mobility for SiC MOSFETs
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- MRS Online Proceedings Library Archive / Volume 622 / 2000
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- 15 March 2011, T8.7.1
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- 2000
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Transport Calculations in Molecular Devices from First Principles
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- MRS Online Proceedings Library Archive / Volume 582 / 1999
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- 21 March 2011, H3.3
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- 1999
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The Enchanting Properties of Oxygen Atoms in Silicon
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- MRS Online Proceedings Library Archive / Volume 209 / 1990
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- 26 February 2011, 103
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- 1990
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Enhanced and Retarded Diffusion of Shallow Impurities in Silicon
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- MRS Online Proceedings Library Archive / Volume 141 / 1988
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- 28 February 2011, 243
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- 1988
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