1 results
Simulation analysis of 1250 kV HRTEM images for threading dislocations in GaN grown on sapphire
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1752-1753
- Print publication:
- July 2012
-
- Article
- Export citation