6 results
Investigations on the Microstructure and Microanalysis of the Gas Shale Sample Prepared by SEM Ion Mill by Off-Centering the Ion Beams
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2108-2109
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- August 2014
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Characterization of Shales by Mass Spectrometry during Ion Milling
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1724-1725
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- August 2014
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Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 632-633
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- July 2011
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Preparation of Materials for EBSD using an Adjustable Broad Beam Ion Source
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 390-391
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- July 2011
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Raising the Standard of Specimen Preparation for Aberration-Corrected TEM and STEM
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- Journal:
- Microscopy Today / Volume 19 / Issue 1 / January 2011
- Published online by Cambridge University Press:
- 11 January 2011, pp. 16-19
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- January 2011
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Automated Sample Preparation of Low-k Dielectrics for FESEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2108-2109
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- August 2005
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