1 results
New Methods for Cross-Section Sample Preparation Using Broad Argon Ion Beam
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1518-1519
- Print publication:
- August 2007
-
- Article
- Export citation