2 results
Interfacial Stress: The Importance of Stress Relaxation in TEM Cross-Sections
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 262-263
- Print publication:
- August 2004
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- Article
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Cluster-Tool Integrated HF Vapor Etching for Native Oxide Free Processing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 315 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 211
- Print publication:
- 1993
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- Article
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