3 results
An Evaluation of an Automated Detection Algorithm to Count Defects Present in X-Ray Topographical Images of SiC Wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 994 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0994-F11-13
- Print publication:
- 2007
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SiC Nanowires by Silicon Carburization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 963 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0963-Q11-03
- Print publication:
- 2006
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Epitaxial Growth and Characterization of SiC on Different Orientations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 911 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0911-B09-01
- Print publication:
- 2006
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