6 results
Theoretical and Experimental Study of Tip Electronic Structure in Scanning Tunneling Microscope
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1177 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1177-Z06-03
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- 2009
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A Scanning Tunneling Microscopy Study: Si/SiO2 Interface Roughness Induced by Chemical Etching
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- Journal:
- MRS Online Proceedings Library Archive / Volume 838 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, O4.9
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- 2004
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Depth Dependence of Dopant Induced Features on The Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling
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- Journal:
- MRS Online Proceedings Library Archive / Volume 699 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, R4.5
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- 2001
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Scanning Tunneling Microscopy Observation Of Single Dangling Bonds on the Si(100)2×1:H Surface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 705 / 2001
- Published online by Cambridge University Press:
- 15 March 2011, Y6.6
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- 2001
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Isotope Exchange in Hydrogenated Silicon-Oxynitride (SiON) for 1.55μm Optical Waveguide Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 609 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, A26.8
- Print publication:
- 2000
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An Alternative Approach for Modeling the Hot Carrier Degradation of the Si/SiO2 Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 513 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 313
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- 1998
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