9 results
Quantum Wells in Zn1-xCdxSe by High Resolution Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1734-1735
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- July 2010
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Metal (Fe, Al)-Fullerene Nanocomposites: Synthesis and Characterization
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1688-1689
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- July 2010
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Quantitative Atomic 3-D Imaging of Single/Double Sheet Graphene Structure by Exit-Wave Reconstruction Using a Titan G2 at 80kV Acceleration Voltage
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1468-1469
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- July 2010
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Co-Cu Alloyed Nanoparticles by Reactive Milling
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1680-1681
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- July 2010
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3-D Reconstruction of the Atomic Positions of Defects in Simulated Gold Nanocrystals: Prospects of Atomic Resolution Electron Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1322-1323
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- August 2007
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Strain Fields at a Thin Ge-Sn Layer Sputtered on Ge by Cs Corrected HREM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 840-841
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- August 2007
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Atomic Resolution Electron Tomography Based on Discrete Mathematics
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1566-1567
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- August 2006
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Characterization of Sputtered Ge-Sn Thin Films by High Resolution Methods
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 712-713
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- August 2006
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Incorporating Prior Knowledge for Atomic Resolution Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1572-1573
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- August 2006
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