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Strain Fields at a Thin Ge-Sn Layer Sputtered on Ge by Cs Corrected HREM
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 840-841
- Print publication:
- August 2007
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Characterization of Sputtered Ge-Sn Thin Films by High Resolution Methods
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 712-713
- Print publication:
- August 2006
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- Article
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