PNDetector

doi:10.1017/S1551929518000172

PNDetector

Published online by Cambridge University Press: 15 March 2018

Abstract

Abstract

An abstract is not available for this content. As you have access to this content, full HTML content is provided on this page. A PDF of this content is also available in through the ‘Save PDF’ action button.

Type: Company Profile
Information: Microscopy Today , Volume 26 , Supplement S1: 2018 Buyers’ Guide , March 2018 , pp. 17

DOI: https://doi.org/10.1017/S1551929518000172 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2018

PNDetector was founded in 2007 with an emphasis on producing innovative and efficient radiation detectors for microanalysis, quality assurance and materials science. Our focus is on developing optimized sensors suited to the individual needs of our customers.

PNDetector’s SDDs are at the forefront of radiation detector technology, as they combine both excellent energy resolution and short processing times. Besides single chip configurations, we build monolithic multi-element and large area SDDs, including unique geometries with maximum solid angle. The SDDs are used in a wide variety of instruments, such as the SEM, TEM, XRF and TXRF.

Recently, PNDetector introduced a compact pnCCD camera system for ultra-fast direct electron detection in TEMs.

High Resolution Silicon Drift Detector

∙ Superior detector performance at all processing times.
∙ High count rates up to 1 Mcps for single SDDs and several Mcps with our Multi-Element SDDs.
∙ Our own silicon fabrication facilities offer an unmatched degree of freedom for custom designs from chip to module.

Backscattered Electron Detector

∙ Excellent performance at fast scan rates increases throughput and enables low dose imaging (Pixel dwell times down to 20 nsec).
∙ High signal to noise ratios due to very low signal capacitance and optimized collection efficiency.
∙ Active area in various sizes available.

pnCCD (S)TEM Camera

∙ The pnCCD (S)TEM camera is a pixelated, ultrafast (up to 4.000 fps), and direct electron detector for applications in TEM and SEM.
∙ Thanks to its outstanding signal to noise ratio, single primary electron detection from 20 keV to 300 keV is possible.
∙ With its high readout speed it opens up new scientific and analytical possibilities in electron microscopy (e.g. 4D-STEM and TEM imaging).

pnCCD Color X-ray Camera

∙ The pnCCD Color X-ray Camera is a high resolution spectroscopic X-ray imaging system for simultaneous time-, energy- and position-revolved measurements (e.g. combined XRF and XRD).
∙ Stand-alone benchtop system inclusive software for ambient and vacuum condition.

Thanks to our many years of experience, we can provide customer specific solutions, helping them to achieve their goals. Please contact us with any ideas you may have and together, we will find a solution.