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Microwave dielectric relaxation of ferroelectric PLZT ceramics in the range of 300-900 K

Published online by Cambridge University Press:  15 August 2001

A. Mouhsen ,
M. E. Achour ,
J. L. Miane  and
J. Ravez
A. Mouhsen*
Affiliation:
Département de Physique, Faculté des Sciences et Techniques, Université Hassan 1er, Settat, Morocco Département de Physique, Faculté des Sciences, Université Moulay Ismaïl, Meknes, Morocco
M. E. Achour
Affiliation:
Département de Physique, Faculté des Sciences, Université Moulay Ismaïl, Meknes, Morocco
J. L. Miane
Affiliation:
PIOM, ENSCPB, avenue Pey-Berland, BP 108, 33402 Talence, France
J. Ravez
Affiliation:
ICMCB, avenue du Dr. A. Schweitzer, 33608 Pessac, France
*
[email protected]
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Abstract

Dielectric response of PLZT(x/65/35) ceramics (with x = 0, 2, 4, 5) was studied using radio frequency and microwave techniques in the temperature range 300−900 K and with a frequency range of 102 Hz-3 × 109 Hz. Dielectric relaxation appears around 1 × 109 Hz at room temperature. The relaxation frequency softens at Tc and the dielectric relaxation exists in both paraelectric and ferroelectric phases and depends on x the lanthanum concentration. A model of correlation chains gives some keys for understanding the frequency behaviour of such materials.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 15 , Issue 2 , August 2001 , pp. 97 - 104
Copyright
© EDP Sciences, 2001

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