Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-26T04:49:14.044Z Has data issue: false hasContentIssue false
  • English
  • Français

Glass transition temperatures of isotactic poly(methymethacrylate) thin films and individual chains probed by multi wavelength ellipsometry

Published online by Cambridge University Press:  28 September 2011

A. El Ouakili ,
G. Vignaud ,
E. Balnois ,
J.-F. Bardeau  and
Y. Grohens
A. El Ouakili
Affiliation:
Laboratoire d'Ingénierie des Matériaux de Bretagne (LIMATB), Université de Bretagne Sud (UEB), Centre de Recherche, BP 92116, Rue Saint Maudé, 56321 Lorient, France Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, Avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
G. Vignaud*
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, Avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
E. Balnois
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, Avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
J.-F. Bardeau
Affiliation:
Laboratoire d'Ingénierie des Matériaux de Bretagne (LIMATB), Université de Bretagne Sud (UEB), Centre de Recherche, BP 92116, Rue Saint Maudé, 56321 Lorient, France
Y. Grohens
Affiliation:
Laboratoire de Physique de l'État Condensé, UMR CNRS 6087, Université du Maine, Avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
*
ae-mail: [email protected]
Get access

Abstract

Ellipsometry is used as a technique to determine glass temperature transitions of isotactic Poly(methyl methacrylate) (iPMMA) ultra-thin films and isolated chains deposited on a silicon wafer surface. The importance of systematically probing the samples at different wavelengths is pointed out in this work since for a similar thin film, slope changes in delta are more or less pronounced according to the wavelength used. The technique performed on iPMMA thin films and isolated globular chains, deposited on Piranha treated surfaces, reveals the presence of multiple transitions, whereas films of comparable thicknesses deposited on HF treated silicon wafers show only one transition. The results confirm the assumptions of a layered structure yielding specific Tg(h) which depends on depth location, which is in good agreement with recent theories of glass transitions in confined polymers, and emphasize the influence of polymer-substrate interactions and chain disentanglement.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 56 , Issue 1: Topical Issue: 5th Colloquium Interdisciplinary in Instrumentation (C2I) 2010 , October 2011 , 13703
Copyright
© EDP Sciences, 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Keddie, J.L., Jones, R.A.L., Cory, R.A., Faraday Discuss. 98, 219 (1994) CrossRef
Beaucage, G., Composto, R., J. Polym. Sci. Part B: Polym. Phys. 31, 319 (1993) CrossRef
Forrest, J.A., Dalnoki-Veress, K., Adv. Coll. Interf. Sci. 94, 167 (2001) CrossRef
Forrest, J.A., Dalnoki-Veress, K., Dutcher, J.R., Phys. Rev. E 56, 5705 (1997) CrossRef
Fukao, K., Miyamoto, Y., Europhys. Lett. 46, 649 (1999) CrossRef
Fukao, K., Miyamoto, Y., Phys. Rev. E 61, 1743 (2000) CrossRef
Priestley, R.D., Broadbelt, L.J., Torkelson, J.M., Fukao, K., Phys. Rev. E 75, 061806 (2007) CrossRef
Wubbenhorst, M., Murray, C.A., Dutcher, J.R., Eur. Phys. J. E 12, S109 (2003) CrossRef
Napolitano, S., Wubbenhorst, M., J. Phys. Chem. B 111, 9197 (2007) CrossRef
Peter, S., Napolitano, S., Meyer, H., Wubbenhorst, M., Baschnagel, J., Macromolecules 41, 7729 (2008) CrossRef
Labahn, D., Mix, R., Schonhals, A., Phys. Rev. E 79, 011801 (2009) CrossRef
Van Zanten, J.H., Wallace, W.E., Wu, W.L., Phys. Rev. E 53, 2053 (1996) CrossRef
Tsui, O.K.C., Russell, T.P., Hawker, C.J., Macromolecules 34, 5535 (2001) CrossRef
Miyazaki, T., Nishida, K., Kanaya, T., Phys. Rev. E 69, 061803 (2004) CrossRef
Fryer, D.S., Peters, R.D., Kim, E.J., Tomaszewski, J.E., de Pablo, J.J., Nealey, P.F., White, C.C., Wu, W.L., Macromolecules 34, 5627 (2001) CrossRef
Ellison, C.J., Kim, S.D., Hall, D.B., Torkelson, J.M., Eur. Phys. J. E 8, 155 (2002) CrossRef
Ellison, C.J., Torkelson, J.M., Nat. Mater. 2, 695 (2003) CrossRef
Ellison, C.J., Ruszkowski, R.L., Fredin, N.J., Torkelson, J.M., Phys. Rev. Lett. 92, 095702 (2004) CrossRef
Ellison, C.J., Mundra, M.K., Torkelson, J.M., Macromolecules 38, 1767 (2005) CrossRef
Priestley, R.D., Ellison, C.J., Broadbelt, L.J., Torkelson, J.M., Science 309, 456 (2005) CrossRef
Mundra, M.K., Ellison, C.J., Behling, R.E., Torkelson, J.M., Polymer 47, 7747 (2006) CrossRef
Mundra, M.K., Ellison, C.J., Rittigstein, P., Torkelson, J.M., Eur. Phys. J. Special Topics 141, 143 (2007) CrossRef
Roth, C.B., Torkelson, J.M., Macromolecules 40, 3328 (2007) CrossRef
Rittigstein, P., Priestley, R.D., Broadbelt, L.J., Torkelson, J.M., Nat. Mater. 6, 278 (2007) CrossRef
Tanaka, K., Tateishi, Y., Okada, Y., Nagamura, T., Doi, M., Morita, H., J. Phys. Chem. B 113, 4571 (2009) CrossRef
Vignaud, G., Bardeau, J.-F., Gibaud, A., Grohens, Y., Langmuir 21, 8601 (2005) CrossRef
Zheng, X., Rafailovich, M.H., Sokolov, J., Phys. Rev. Lett. 79, 241 (1997) CrossRef
Tsui, O.K.C., Zhang, H.F., Macromolecules 34, 9139 (2001) CrossRef
Grohens, Y., Hamon, L., Reiter, G., Soldera, A., Holl, Y., Eur. Phys. J. E 8, 217 (2002) CrossRef
Fakhraai, Z., Forrest, J.A., Phys. Rev. Lett. 95, 025701 (2005) CrossRef
Park, C.H., Kim, J.H., Ree, M., Sohn, B.H., Jung, J.C., Zin, W.C., Polymer 45, 4507 (2004) CrossRef
Campbell, C.G., Vogt, B.D., Polymer 48, 7169 (2007) CrossRef
Raegen, A., Massa, M., Forrest, J., Dalnoki-Veress, K., Eur. Phys. J. E 27, 375 (2008) CrossRef
Kawana, S., Jones, R.A.L., Phys. Rev. E 63, 021501 (2001) CrossRef
Kim, S., Hewlett, S.A., Roth, C.B., Torkelson, J.M., Eur. Phys. J. E 30, 83 (2009) CrossRef
DeMaggio, G.B., Frieze, W.E., Gidley, D.W., Hristov, H.A., Yee, A.F., Phys. Rev. Lett. 78, 1524 (1997) CrossRef
Dumas, P., Cwal, Y.J., Jakob, P., Surf. Sci. 867, 269 (1992)
Owens, D.K., Wendt, R.C., J. Appl. Polym. Sci. 13, 1741 (1969) CrossRef
H.G. Tompkins, E.A. Irene (eds.), Handbook of Ellipsometry (William Andrew Publishing–Springer, New York, 2005), p. 282
M.L. Hair, in Colloidal silica: fundamentals and applications, edited by H.E. Bergna, W.O. Roberts (CRC Press, Taylor & Francis, 2006), p.257
Roth, C.B., Pound, A., Kamp, S.W., Murray, C.A., Dutcher, J.R., Eur. Phys. J. E 20, 441 (2006) CrossRef
Grohens, Y., Prud'homme, R.E., Schultz, J., Macromolecules 31, 2545 (1998) CrossRef
Balnois, E., Wilkinson, K.J., Lead, J.R., Buffle, J., Environ. Sci. Technol. 33, 3911 (1999) CrossRef
Kumaki, J., Kawauchi, T., Yashima, E., Macromolecules 39, 1209 (2006) CrossRef
Serghei, A., Macromol. Chem. Phys. 209, 1415 (2008) CrossRef
Narladkar, A., Balnois, E., Vignaud, G., Grohens, Y., Macromol. Symp. 273, 146 (2008) CrossRef
Donth, E., Huth, H., Beiner, M., J. Phys. Condens. Matter 13, 451 (2001) CrossRef
Itagaki, H., Nishimura, Y., Sagisaka, E., Grohens, Y., Langmuir 22, 742 (2006) CrossRef
Si, L., Massa, M.V., Dalnoki-Veress, K., Brown, H.R., Jones, R.A.L., Phys. Rev. Lett. 94, 127801 (2005) CrossRef