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S29 A Method for Determination of 2nd Rank Strain Tensor From Nanocrystalline Diffraction Data and Its Application to Micromechanical Deformation

Published online by Cambridge University Press:  20 May 2016

A. Mehta
Affiliation:
SLAC/Stanford, Menlo Park, CA
M. Bibee
Affiliation:
SLAC/Stanford, Menlo Park, CA
D. Bronfenbrenner
Affiliation:
UC Berkeley, Berkeley, CA

Abstract

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Type
DENVER X-RAY CONFERENCE
Copyright
Copyright © Cambridge University Press 2008

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