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S218 Invited—From Surface Profile to Residual Stress Using the Contour Method

Published online by Cambridge University Press:  20 May 2016

Y. S. Xiong ,
J. Kelleher ,
P. Frankel  and
P. Withers
Y. S. Xiong
Affiliation:
University of Manchester, Manchester, UK
J. Kelleher
Affiliation:
University of Manchester, Manchester, UK
P. Frankel
Affiliation:
University of Manchester, Manchester, UK
P. Withers
Affiliation:
University of Manchester, Manchester, UK
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 187
Copyright
Copyright © Cambridge University Press 2008

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