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F-68 Quantitative Analysis of Low Level Toxic Elements in Surface Layer Using HDXRF

Published online by Cambridge University Press:  20 May 2016

Z. W. Chen ,
D. Li ,
K. Xin ,
A. Verchinine ,
W. M. Gibson  and
D. Gibson
Z. W. Chen
Affiliation:
X-ray Optical Systems, East Greenbush, NY
D. Li
Affiliation:
X-ray Optical Systems, East Greenbush, NY
K. Xin
Affiliation:
X-ray Optical Systems, East Greenbush, NY
A. Verchinine
Affiliation:
X-ray Optical Systems, East Greenbush, NY
W. M. Gibson
Affiliation:
X-ray Optical Systems, East Greenbush, NY
D. Gibson
Affiliation:
X-ray Optical Systems, East Greenbush, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 166
Copyright
Copyright © Cambridge University Press 2009

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