Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T12:56:13.069Z Has data issue: false hasContentIssue false

S185 Invited—Using Finite Element Analysis and Synchrotron X-ray Diffraction to Understand Stress Distributions in Deforming Polycrystals

Published online by Cambridge University Press:  20 May 2016

M. P. Miller
Affiliation:
Cornell University, Ithaca, NY
J.-S. Park
Affiliation:
Cornell University, Ithaca, NY
P. R. Dawson
Affiliation:
Cornell University, Ithaca, NY
T.-S. Han
Affiliation:
Yonsei University, Seoul, Korea

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
DENVER X-RAY CONFERENCE
Copyright
Copyright © Cambridge University Press 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)