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F-26 New Detector Architectures with Silicon Drift Detectors for XRF Applications

Published online by Cambridge University Press:  20 May 2016

A. Simsek ,
O. Jaritschin ,
A. Liebel ,
P. Lechner ,
G. Lutz ,
A. Bechteler ,
A. Niculae ,
H. Soltau ,
R. Echkardt  and
K. Hermenau
...Show all authors
A. Simsek
Affiliation:
PNDetector GmbH, Munich, Germany
O. Jaritschin
Affiliation:
PNDetector GmbH, Munich, Germany
A. Liebel
Affiliation:
PNDetector GmbH, Munich, Germany
P. Lechner
Affiliation:
PNDetector GmbH, Munich, Germany
G. Lutz
Affiliation:
PNDetector GmbH, Munich, Germany
A. Bechteler
Affiliation:
PNSensor GmbH, Munich, Germany
A. Niculae
Affiliation:
PNSensor GmbH, Munich, Germany
H. Soltau
Affiliation:
PNSensor GmbH, Munich, Germany
R. Echkardt
Affiliation:
PNSensor GmbH, Munich, Germany
K. Hermenau
Affiliation:
PNSensor GmbH, Munich, Germany
F. Schopper
Affiliation:
MPI Halbleiterlabor, Munich, Germany
L. Strüder
Affiliation:
MPI Halbleiterlabor, Munich, Germany
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 164
Copyright
Copyright © Cambridge University Press 2009

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