Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-23T02:23:59.774Z Has data issue: false hasContentIssue false
  • English
  • Français

D-67 High-Resolution X-ray Diffraction Data Analysis From The Partly Relaxed Semiconductor Structures

Published online by Cambridge University Press:  20 May 2016

A. Ulyanenkov ,
A. Benediktovitch ,
I. Feranchuk ,
B. He  and
H. Ress
A. Ulyanenkov
Affiliation:
Bruker AXS GmbH, Karlsruhe, Germany
A. Benediktovitch
Affiliation:
Belarussian State University, Minsk, Belarus
I. Feranchuk
Affiliation:
Belarussian State University, Minsk, Belarus
B. He
Affiliation:
Bruker AXS, Inc., Madison, WI
H. Ress
Affiliation:
Bruker AXS, Inc., Madison, WI
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 171
Copyright
Copyright © Cambridge University Press 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)