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Cytological analysis of wheat infection by the leaf blotch pathogen Mycosphaerella graminicola

Published online by Cambridge University Press:  03 November 2000

Keith E. DUNCAN  and
Richard J. HOWARD
Keith E. DUNCAN
Affiliation:
DuPont Company, Agricultural Products, Experimental Station, Powder Mill Road, Wilmington, Delaware, DE 19880–0402, USA.
Richard J. HOWARD
Affiliation:
DuPont Company, Agricultural Products, Experimental Station, Powder Mill Road, Wilmington, Delaware, DE 19880–0402, USA.
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Abstract

We have investigated the wheat infection process of Mycosphaerella graminicola (teleomorph of Septoria tritici) through the combined application of differential interference contrast light, confocal laser scanning, and cryo-scanning electron microscopies. Several aspects of fungal development have been documented, including the presence of extracellular cirrus and germling matrices, as well as nutrient-sensitive morphogenesis. The use of confocal laser scanning microscopy was invaluable in documenting the time course of pathogen invasion and symptom development. These data were used to generate summary diagrams of the asexual infection cycle of M. graminicola, to benchmark the efficacy of various crop protection strategies.

Type
Research Article
Information
Mycological Research , Volume 104 , Issue 9 , September 2000 , pp. 1074 - 1082
Copyright
© The British Mycological Society 2000

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