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ZnSxO1-x Films Grown on Flexible Substrates

Published online by Cambridge University Press:  27 February 2012

Jesse Huso
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
Hui Che
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
John L. Morrison
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
Dinesh Thapa
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
Michelle Huso
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
Stanley Rhodes
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
Brianna Blanchard
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
Wei Jiang Yeh
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
M. D. McCluskey
Affiliation:
Department of Physics and Materials Science Program, Washington State University Pullman, WA 99164-2814, U.S.A.
Leah Bergman
Affiliation:
Physics Department, University of Idaho Moscow, ID 83844-0903, U.S.A.
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Abstract

Bandgap engineered ZnSxO1-x films were grown on Fluorinated Ethylene Propylene (FEP) substrates and analyzed using transmission spectroscopy. FEP is considered as a potential substrate for application in flexible electronics and semiconductor films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Kukreja, L. M., Barik, S. and Misra, P., J. Cry. Growth 268, 531 (2004).Google Scholar
2. Makino, T., Segawa, Y., Kawasaki, M., Ohtomo, A., Shiroki, R., Tamura, K., Yasuda, T. and Koinuma, H., Appl. Phys. Lett. 78, 1237 (2001).Google Scholar
3. Mayer, M. A., Speaks, D. T., Yu, K. M., Mao, S. S., Haller, E. E. and Walukiewicz, W., Appl. Phys. Lett. 97 022104 (2010).Google Scholar
4. Polity, A., Meyer, B. K., Krämer, T., Wang, C., Haboeck, U., Hoffmann, A., Phys. Stat. Sol. (a) 203, 2867 (2006).Google Scholar
5. Moon, C.-Y., Wei, S.-H., Zhu, Y. Z. and Chen, G. D., Phys. Rev. B 74, 233202 (2006).Google Scholar
6. Pagliaro, M., Ciriminna, R., Palmisano, G., ChemSusChem 1, 880 (2008).Google Scholar
7. Kim, R.-H., Kim, D.-H., Xiao, J., Kim, B. H., Park, S.-I., Panilaitis, B., Ghaffari, R., Yao, J., Li, M., Liu, Z., Malyarchuk, V., Kim, D. G., Le, A.-P., Nuzzo, R. G., Kaplan, D. L., Omenetto, F. G., Huang, Y., Kang, Z. and Rogers, J. A., Nature Materials 9, 929 (2010).Google Scholar
8. Huso, J., Morrison, J. L., Che, H., Sundararajan, J. P., Yeh, W. J., McIlroy, D., Williams, T. J. and Bergman, L., Journal of Nanomaterials 2011, 691582.Google Scholar
9. PTFE is perhaps better known by its trade name Teflon.Google Scholar
11. Crosby, J. M., Carreno, C. A. and Talley, K. L., Polymer Composites 3, 97 (1982).Google Scholar
12. Pankove, J. I., Optical Processes in Semiconductors, 1st ed. (Prentice-Hall, Englewood Cliffs, 1971) pg. 36.Google Scholar
13. Viswanatha, R., Chakraborty, S., Basu, S. and Sarma, D. D., J. Phys. Chem. B 110, 22310 (2006).Google Scholar
14. Sinha, G., Adhikary, K. and Chaudhuri, S., J. Crystal Growth 276, 204 (2005).Google Scholar