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The X-Ray Spectral Microinvestigation of the Chinical States of Atoms in CdxHg1-x Te/GaAs Thin Fiit.

Published online by Cambridge University Press:  21 February 2011

V. V. Rezvitskii ,
B. A. Treicer ,
I. I. Bondarenko ,
L. A. Volkov  and
L. N. Mazalov
V. V. Rezvitskii
Affiliation:
Pedagogical Institute. ul.Shevchenko, 1, 316050 Kirovograd, USSR
B. A. Treicer
Affiliation:
Pedagogical Institute. ul.Shevchenko, 1, 316050 Kirovograd, USSR
I. I. Bondarenko
Affiliation:
Pedagogical Institute. ul.Shevchenko, 1, 316050 Kirovograd, USSR
L. A. Volkov
Affiliation:
Pedagogical Institute. ul.Shevchenko, 1, 316050 Kirovograd, USSR
L. N. Mazalov
Affiliation:
Institute of Inorganic Chemistry, prosp. Acad. Lavrent'eva, 3, 630090 Novosibirsk, USSR
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Abstract

The results of the x-ray spectral investigations of CdxHg1-xTe/GaAs thin films conducted with the help of “Camebax - microbeam” electron microprobe are presented. It is shown that the sensitivity of the microprobe combined with the mathematical processing based on the chemometric approaches Is sufficient to reveal the effects of the chemical bond on x-ray spectra.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 228: Symposium N – Materials for Optical Information Processing , 1991 , 313
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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